Probing the Crystallography of Ordered Phases by coupling Orientation Microscopy and Atom Probe Tomography
نویسندگان
چکیده
Superalloys are a class of materials that possess stable microstructures at elevated temperatures due to the presence of coherent L12 ordered γ’ precipitates spatially aligned along elastically soft directions in a face centered cubic (FCC) γ matrix [1]. Nickel-base superalloys are used in a variety of applications such as in turbine blades of aircraft engines and land-based turbine engine [1]. The recent discovery of novel Co-base alloys [2] which also form γ-γ’ microstructures, similar to nickel base superalloys, has led to rapid research in these alloys as potential next generation superalloys.
منابع مشابه
A Non-Demolition Photon Counting Method by Four-Level Inverted Y-Type Atom
The semi-classical model of atom-field interaction has been fully studied for some multilevel atoms, e.g. Vee, L, Cascade X , Y, and inverted Y and so on. This issue is developed into the full-quantum electrodynamics formalism, where the probe and coupling electromagnetic fields are quantized. In this article, we investigate the full-quantum model of absorption and dispersion spectrum of trappe...
متن کاملDirect atomic-scale imaging of hydrogen and oxygen interstitials in pure niobium using atom-probe tomography and aberration-corrected scanning transmission electron microscopy.
Imaging the three-dimensional atomic-scale structure of complex interfaces has been the goal of many recent studies, due to its importance to technologically relevant areas. Combining atom-probe tomography and aberration-corrected scanning transmission electron microscopy (STEM), we present an atomic-scale study of ultrathin (~5 nm) native oxide layers on niobium (Nb) and the formation of order...
متن کاملCombining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography.
In many cases, the three-dimensional reconstructions from atom probe tomography (APT) are not sufficiently accurate to resolve crystallographic features such as lattice planes, shear bands, stacking faults, dislocations or grain boundaries. Hence, correlative crystallographic characterization is required in addition to APT at the exact same location of the specimen. Also, for the site-specific ...
متن کاملA study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کاملA study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کامل